Amorphous Silicon Dioxide Formula: SiO2 Low Loss

Submitted by (Dr) Marie Cheynet, May 26, 2005.

Source / Purity: 50 nm layer

Author Comments: Analyst: M. Cheynet - R. Pantel. Temperature: Room.

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Spectrum Metadata

Specimen Name
CM20
Spectrum Type
Low Loss
Specimen Formula
SiO2
Data Range
-8.5 eV - 93.6 eV
Source and Purity
50 nm layer
Keywords
imported from old site
Alternative URL
Old EELS DB
Microscope Name / Model
CM20
Gun Type
feg Schottky
Incident Beam Energy
200 kV
Resolution
0.7 eV
Dispersion
0.1 eV/pixel
Acquisition Mode
Imaging
Convergence Semi-angle
3 mrad
Collection Semi-angle
13 mrad
Probe Size
20 nm2
Integration Time
1 secs
Number of Readouts
3
Detector
Parallel: GIF
Dark Current Correction
Yes
Gain Variation Spectrum
Yes
Relative Thickness
0.35 t/λ