Ge Formula: Ge Core Loss

Submitted by aneeqa, November 25, 2016.

Source / Purity: Ge wafer

Author Comments: From a spectrum image of 2250 pixels over a range of thickness

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Spectrum Metadata

Specimen Name
Probe Corrected Jeol ARM 200F
Spectrum Type
Core Loss
Specimen Formula
Ge
Data Range
713.3 eV - 1724.8 eV
Source and Purity
Ge wafer
Elemental Edges
Ge_L1, Ge_L2,3
Microscope Name / Model
Probe Corrected Jeol ARM 200F
Gun Type
Cold FEG
Incident Beam Energy
200 kV
Resolution
0.5 eV
Monochromated
No
Dispersion
0.5 eV/pixel
Acquisition Mode
stem
Convergence Semi-angle
29 mrad
Collection Semi-angle
36 mrad
Integration Time
0.2498 secs
Number of Readouts
2250
Detector
GIF Quantum ER
Dark Current Correction
Yes
Gain Variation Spectrum
Yes
Calibration
Low loss + drift tube
Relative Thickness
0.55 t/λ
Deconvolutions
Fourier-ratio