Si Formula: Si Low Loss

Submitted by aneeqa, November 25, 2016.

Source / Purity: Si wafer

Author Comments: From spectrum image of 1800 pixels over a range of thickness

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Chart x axis limited to > 2 eV due to low loss spectrum type. Click here to remove this limit. You may also manually set the axis limits.

Spectrum Metadata

Specimen Name
Probe Corrected Jeol ARM 200F
Spectrum Type
Low Loss
Specimen Formula
Si
Data Range
-34.39 eV - 159.61 eV
Source and Purity
Si wafer
Microscope Name / Model
Probe Corrected Jeol ARM 200F
Gun Type
Cold FEG
Incident Beam Energy
200 kV
Resolution
0.5 eV
Monochromated
No
Dispersion
0.5 eV/pixel
Acquisition Mode
stem
Convergence Semi-angle
29 mrad
Collection Semi-angle
36 mrad
Integration Time
0.0000996 secs
Number of Readouts
1800
Detector
GIF Quantum ER
Dark Current Correction
Yes
Gain Variation Spectrum
Yes
Calibration
Low loss + drift tube
Relative Thickness
0.708 t/λ
Deconvolutions
Fourier-ratio