Si Formula: Si Core Loss

Submitted by aneeqa, November 25, 2016.

Source / Purity: Si wafer

Author Comments: From a spectrum image of 1800 pixels over a range of thickness

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Spectrum Metadata

Specimen Name
Probe Corrected Jeol ARM 200F
Spectrum Type
Core Loss
Specimen Formula
Si
Data Range
1025.11 eV - 2021.11 eV
Source and Purity
Si wafer
Elemental Edges
Si_K
Microscope Name / Model
Probe Corrected Jeol ARM 200F
Gun Type
Cold FEG
Incident Beam Energy
200 kV
Resolution
0.5 eV
Monochromated
No
Dispersion
0.5 eV/pixel
Acquisition Mode
stem
Convergence Semi-angle
29 mrad
Collection Semi-angle
36 mrad
Integration Time
0.2499 secs
Number of Readouts
1800
Detector
GIF Quantum ER
Dark Current Correction
Yes
Gain Variation Spectrum
Yes
Calibration
Low loss + drift tube
Relative Thickness
0.708 t/λ
Deconvolutions
Fourier-ratio