Silicon Formula: Si Low Loss

Submitted by Sylvie Schamm, April 20, 2005.

Source / Purity: Wafer

Author Comments: biblio cited in "Reference" for calibration purpose Dispersion is not 0.09 eV/ch but 0.098 eV/ch Analyst: S.Schamm. Temperature: Room.

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Spectrum Metadata

Specimen Name
CM20
Spectrum Type
Low Loss
Specimen Formula
Si
Data Range
-17.42 eV - 82.87 eV
Source and Purity
wafer
Keywords
imported from old site
Alternative URL
Old EELS DB
Microscope Name / Model
CM20
Gun Type
LaB6
Incident Beam Energy
100 kV
Resolution
1.08 eV
Dispersion
0.098 eV/pixel
Acquisition Mode
Diffraction
Convergence Semi-angle
5.1 mrad
Collection Semi-angle
1.6 mrad
Probe Size
55 nm2
Integration Time
0.063 secs
Number of Readouts
20
Detector
Parallel: 666 Gatan
Dark Current Correction
Yes
Gain Variation Spectrum
Yes
Relative Thickness
0.4 t/λ
Reference
P.E. Batson 3M 2 (1991) 395-402