Silicon Formula: Si Core Loss

Submitted by Sylvie Schamm, November 19, 2007.

Source / Purity: Wafer

Author Comments: Directly connected to "Si-ds.XY" : after deconvolution and normalization dispersion not 0.19 eV/ch but 0.197 eV/ch Analyst: S.Schamm. Temperature: Room.

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Spectrum Metadata

Specimen Name
CM20
Spectrum Type
Core Loss
Specimen Formula
Si
Data Range
90.31 eV - 173.57 eV
Source and Purity
wafer
Elemental Edges
Si_L2,3
Keywords
imported from old site
Alternative URL
Old EELS DB
Microscope Name / Model
CM20
Gun Type
LaB6
Incident Beam Energy
100 kV
Resolution
1.08 eV
Dispersion
0.197 eV/pixel
Acquisition Mode
Diffraction
Convergence Semi-angle
5.1 mrad
Collection Semi-angle
6.14 mrad
Detector
Parallel: 666 Gatan
Dark Current Correction
No
Gain Variation Spectrum
No
Relative Thickness
0.4 t/λ
Reference
P.E. Batson 3M 2 (1991) 395-402